Dongguan Jianchuang Electronic Technology Co., Ltd.
+86 13688943677zx_he@cn-simple.comRFQ
Chipsimple Electronic Tech
Menu

Engineering Library

Practical guidance for ceramic circuits, materials, manufacturing and design.

Operator using an optical image measurement system
Technical resources
776
Engineering fields
8
Showing now
41–60

Quality and application guides

Technical resources for substrate selection, manufacturing, applications, design, quality, sourcing, and supporting documentation.

100
  1. Scanned Insulation Tests: Track Bias Age Separately for Every ChannelQuality & TestingQuality guide
  2. HiPot Trip Events: Capacitive Charging Is Not the Same as BreakdownQuality & TestingQuality guide
  3. Heater Thermal Maps: Compare Temperature Spread at the Same Operating StateQuality & TestingQuality guide
  4. Heater Resistance Drift During Cycling: Compare at a Common Reference StateQuality & TestingQuality guide
  5. Chemical Exposure Tests: Maintain Concentration as the Bath EvaporatesQuality & TestingQuality guide
  6. Ceramic Cross-Sections: Correct Apparent Thickness from an Oblique CutQuality & TestingQuality guide
  7. Resistance Sampling Order: Separate Warm-Up Drift from Tray PositionQuality & TestingQuality guide
  8. Thickness Maps: Choose Locations That Can Reveal Edge and Center DifferencesQuality & TestingQuality guide
  9. Via Sampling Plans: Separate Holes, Circuits and PanelsQuality & TestingQuality guide
  10. Heater Mapping Samples: Rotate Fixtures to Separate Product and Camera BiasQuality & TestingQuality guide
  11. Heater Power-Cycling Controls: Separate Electrical Stress from Thermal ExposureQuality & TestingQuality guide
  12. Chemical Compatibility Coupons: Control Exposed Edge Area as Well as Face AreaQuality & TestingQuality guide
  13. Cross-Section Location Plans: Do Not Miss a Small Via Defect with One CutQuality & TestingQuality guide
  14. Resistance Test Uncertainty: Reading Error, Range Error and ResolutionQuality & TestingQuality guide
  15. TCR Uncertainty When Temperature and Resistance Errors Are CorrelatedQuality & TestingQuality guide
  16. Thickness Measurement Uncertainty: Include Reference-Plane TiltQuality & TestingQuality guide
  17. Via-Chain Resistance: Move Sense Boundaries Before Subtracting Access LossQuality & TestingQuality guide
  18. Insulation Resistance Reports: Propagate Voltage and Current UncertaintyQuality & TestingQuality guide
  19. Withstand Test Records: Verify Delivered Voltage During Current LimitingQuality & TestingQuality guide
  20. Power-Cycling Data: Account for Missing Cycles and Interrupted TestsQuality & TestingQuality guide